Peer-reviewed Publications:
[ICPR24] Ethan Payne, David Patrick, Amanda S. Fernandez. Explaining Model Parameters Using the Product Space. IAPR International Conference on Pattern Recognition (ICPR), Kolkata India, December 2024.
[ICPR24] Ethan Payne, David Patrick, Amanda S. Fernandez. Visualizing and Generalizing Integrated Attributions. IAPR International Conference on Pattern Recognition (ICPR), Kolkata India, December 2024.
[IEEEAccess] Christopher Snyder, Katherine I Montoya, David Patrick, Jordan Stone, Daniel Mohanadhas, Elizabeth S Sooby, Amanda S Fernandez. Semantic Segmentation of Micrographs for Nuclear Fuel Analysis and Degradation Quantification. IEEE Access, November 2023.
[WACV-W22]: David Patrick, Michael Geyer, Richard Tran, Amanda Fernandez. Reconstructive Training for Real-World Robustness in Image Classification. In WACV Workshop for Dealing with Novelty in Open Worlds, 2022.